Details, datasheet, quote on part number: IDT74FCT821ASOB
PartIDT74FCT821ASOB
CategoryLogic => Bus Interface => Bus Oriented Circuits
TitleBus Oriented Circuits
DescriptionHigh Performance CMOS Bus Interface Register
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT74FCT821ASOB datasheet
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Features, Applications

Equivalent to AMD's Am29821-25 bipolar registers in pinout/ function, speed and output drive over full temperature and voltage supply extremes IDT54/74FCT821A equivalent to FASTTM speed IDT54/74FCT821B 25% faster than FAST IOL = 48mA (commercial) and 32mA (military) Clamp diodes on all inputs for ringing suppression CMOS power levels (1mW typ. static) TTL input and output compatibility CMOS output level compatible Substantially lower input current levels than AMD's bipolar Am29800 series (5A max.) Military product compliant to MIL-STD-883, Class B Available in the following packages: Commercial: SOIC Military: CERDIP, LCC

The FCT821 series is built using an advanced dual metal CMOS technology. The FCT821 series bus interface registers are designed to eliminate the extra packages required to buffer existing registers and provide extra data width for wider address/data paths or buses carrying parity. The is a buffered, 10-bit wide version of the popular FCT374 function. The FCT821 high-performance interface family is designed for highcapacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes and all outputs are designed for low-capacitance bus loading in high-impedance state.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

Symbol VTERM(3) TA TBIAS TSTG PT IOUT Rating Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Operating Temperature Under Bias Storage Temperature Power Dissipation DC Output Current 0.5 to VCC 0.5 to VCC V Commercial to +7 Military to +7 Unit V

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Outputs and I/O terminals only.

Pin Name Dx CP I/O Description D Flip-Flop Data Inputs Clock Pulse for the Register. Enters data into the register on the LOW-to-HIGH transition Register 3-State Outputs Output Control. When the OE input is HIGH, the Yx outputs are in the high impedance state. When the OE input is LOW, the TRUE register data is present at the Yx outputs.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.
OE Inputs Dx CP Outputs Yx NC Function High Z Clear Hold Load

NOTE: H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High Impedance = No Change = LOW-to-HIGH transition

Following Conditions Apply Unless Otherwise Specified: Commercial: to +70C, VCC 5.0V 5%; Military: to +125C, VCC 5.0V 10%

Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VOH Clamp Diode Voltage Short Circuit Current Output HIGH Voltage VCC = Min., IIN = 18mA VCC = Max., VO = VCC = 3V, VIN = VLC or VHC, IOH = 32A VCC = Min IOH = 300A VIN = VIH or VIL IOH = 15mA MIL IOH = 24mA COM VCC = 3V, VIN = VLC or VHC, IOL = 300A VCC = Min IOL = 300A VIN = VIH or VIL IOL = 32mA MIL IOL = 48mA COM GND(3) Parameter Input HIGH Level Input LOW Level Input HIGH Current Input LOW Current Off State (High Impedance) Output Current Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max. VI = VCC VI = GND VO = VCC VO = GND Min. 2 75 VHC 0.7 120 VCC 4.3 GND 0.3 Max. VLC VLC(4) 0.5 Unit V A

NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. This parameter is guaranteed, but not tested.


 

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