Details, datasheet, quote on part number: IDT74FCT541CE
PartIDT74FCT541CE
CategoryLogic => Buffers/Inverters => 2-State => CMOS/BiCMOS->FCT/FCT-T Family
TitleCMOS/BiCMOS->FCT/FCT-T Family
DescriptionFast CMOS Octal Buffer/line Driver
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT74FCT541CE datasheet
Cross ref.Similar parts: 74AC11240, 74AC11244, 74AC11245, CD54AC240, CD54AC244, CD54AC374, CD54ACT245, CD54HC125, CD54HC126, CD54HCT125
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Features, Applications

IDT54/74FCT541 equivalent to FASTTM speed and drive IDT54/74FCT541A 25% faster than FAST to 55% faster than FAST IOL = 64mA (commercial) and 48mA (military) CMOS power levels (1mW typ. static) Product available in Radiation Tolerant and Radiation Enhanced versions Military product compliant to MIL-STD-883, Class B Meets or exceeds JEDEC Standard 18 specifications

The IDT octal buffer/line drivers are built using an advanced dual metal CMOS technology. The IDT54/74FCT541/A/C is designed to be employed as a memory and address driver, clock driver and bus-oriented transmitter/ receiver which provides improved board density. The C is similar in function to the IDT54/74FCT244/A/C, except that the inputs and outputs are on opposite sides of the package. This pinout arrangement makes these devices especially useful as output ports for microprocessors and as backplane drivers, allowing ease of layout and greater board density.


Symbol VTERM(3) TA TBIAS TSTG PT IOUT Rating Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Operating Temperature Under Bias Storage Temperature Power Dissipation DC Output Current Commercial ­0.5 to VCC 0.5 120 Military ­0.5 to VCC 0.5 120 Unit W mA

Pin Names OEA, OEB Dx Ox Description 3­State Output Enable Inputs (Active LOW) Inputs Outputs

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only.

NOTE: H = High Voltage Level X = Don't Care L = Low Voltage Level Z = HIGH Impedance

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC - 0.2V Commercial: to +70°C, VCC ± 5%; Military: to +125°C, VCC ± 10%

Symbol VIH VIL II L IOZH IOZL VIK IOS VOH Clamp Diode Voltage Short Circuit Current Output HIGH Voltage CC = Min., = ­18mA VCC VO = GND VCC = 3V, VIN = VLC or VHC, IOH ­32΅ A VCC = Min. VIN = VIH or VIL VOL Output LOW Voltage IOH ­300΅ A IOH = ­12mA MIL. IOH = ­15mA COM'L. VCC = 3V, VIN = VLC or VHC, IOL 300΅ A VCC = Min. VIN = VIH or VIL IOL 300΅ A IOL = 48mA MIL. IOL = 64mA COM'L. Parameter Input HIGH Level Input LOW Level Input HIGH Current Input LOW Current Off State (High Impedance) Output Current VCC = Max. Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC VI = GND VO = VCC VO = GND Min. 2 ­60 VHC ­0.7 ­120 VCC 4.3 GND 0.3 Max. VLC VLC(4) 0.55

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25°C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested.


 

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