Details, datasheet, quote on part number: IDT74FCT541AT
PartIDT74FCT541AT
CategoryLogic => Line Driver/Receivers => CMOS/BiCMOS->FCT/FCT-T Family
TitleCMOS/BiCMOS->FCT/FCT-T Family
DescriptionFast CMOS Octal Buffer/line Driver
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT74FCT541AT datasheet
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Features, Applications

Std., A, and C grades Low input and output leakage 1µA (max.) CMOS power levels True TTL input and output compatibility: ­ VOH = 3.3V (typ.) ­ VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 64mA IOL) Meets or exceeds JEDEC standard 18 specifications Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked) Power off disable outputs permit "live insertion" Available in the following packages: ­ Industrial: SOIC, SSOP, QSOP, TSSOP ­ Military: CERDIP, LCC

The IDT octal buffer/line driver is built using an advanced dual metal CMOS technology. The FCT541T is similar in function to the FCT244T, except that the inputs and outputs are on opposite sides of the package. This pinout arrangement makes these devices especially useful as output ports for microprocessors and as backplane drivers, allowing ease of layout and greater board density.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.
CERDIP/ SOIC/ SSOP/ QSOP/ TSSOP TOP VIEW

Symbol Description Max to +120 Unit mA VTERM(2) Terminal Voltage with Respect to GND VTERM(3) Terminal Voltage with Respect to GND TSTG IOUT Storage Temperature DC Output Current

Pin Names OEA, OEB Dx Ox Inputs Outputs Description 3-State Output Enable Inputs (Active LOW)

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF

NOTE: H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Z = High Impedance
NOTE: 1. This parameter is measured at characterization but not tested.

Following Conditions Apply Unless Otherwise Specified: Industrial: to +85°C, VCC 5.0V ±5%; Military: to +125°C, VCC 5.0V ±10%

Symbol VIH VIL IIH IIL IOZH IOZL II VIK VH ICC Parameter Input HIGH Level Input LOW Level Input HIGH Current(4) Input LOW Current(4) High Impedance Output Current (3-State output pins)(4) Input HIGH Current(4) Clamp Diode Voltage Input Hysteresis Quiescent Power Supply Current VCC = Max., VI = VCC (Max.) VCC = Min, IIN = -18mA VCC = Max., VIN = GND or VCC Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max = 0.5V Min. 200 0.01 Max. mV mA Unit V µA

Symbol VOH Parameter Output HIGH Voltage Test Conditions(1) VCC = Min IOH = ­6mA MIL VIN = VIH or VIL IOH = ­8mA IND IOH = ­12mA MIL IOH = ­15mA IND VCC = Min IOL = 48mA MIL VIN = VIH or VIL IOL = 64mA IND VCC = Max., = GND(3) Min. ­60 Typ.(2) Max. V mA Unit V

NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter = ­55°C.


 

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