Details, datasheet, quote on part number: IDT54FCT162H244ETPAB
PartIDT54FCT162H244ETPAB
CategoryLogic => Line Driver/Receivers => CMOS/BiCMOS->FCT/FCT-T Family
TitleCMOS/BiCMOS->FCT/FCT-T Family
DescriptionFast CMOS 16-bit Buffer/line Driver
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT162H244ETPAB datasheet
  

 

Features, Applications

MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage 1 A (max.) ESD > 2000V per MIL-STD-883, Method > 200V using machine model 0) 25 mil pitch SSOP, 19.6 mil pitch TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch CERPACK packages Extended commercial range to +85C Bus-Hold retains last active bus state during 3-state Eliminates the need for external pull up resistors

The FCT162H244T/AT/CT/ET 16-Bit Buffer/Line Driver is for bus interface or signal buffering applications requiring high speed and low power dissipation. These devices have a flow through pin organization, and shrink packaging to simplify board layout. All inputs are designed with hysteresis for improved noise margin. The three-state controls allow independent 8bit or combined 16-bit operation. These parts are plug in replacements for 54/ 74ABT16244 where higher speed, lower noise or lower power dissipation levels are desired. The FCT162H244T/AT/CT/ET has "Bus-Hold" which retains the input's last state whenever the input goes to high impedance. This prevents "floating" inputs and eliminates the need for pull-up/down resistors.


Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXXT Output and I/O terminals. 3. Output and I/O terminals for FCT162XXXT. FCT162XXXT and FCT166XXXT.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 Max. 6 8 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Pin Names xOE xAx xYx Description 3State Output Enable Inputs (Active LOW) Data Inputs(1) 3-State Outputs

NOTE: 1. These pins have "Bus-hold". All other pins are standard inputs, outputs, or I/Os.
NOTE: H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Z = High-Impedance

Following Conditions Apply Unless Otherwise Specified: Commercial: to +85C, VCC 5.0V 10%; Military: to +125C, VCC 5.0V 10%

Symbol VIH VIL IIH Parameter Input HIGH Level Input LOW Level Input HIGH Current(4) IIL Input LOW Current(4) IBHH IBHL IOZH IOZL VIK IOS VH ICCL ICCH ICCZ Bus-hold Sustain Current(4) High Impedance Output Current (3-State Output pins)(5, 6) Clamp Diode Voltage Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC = Min., IIN = 18mA VCC = Max., = GND(3) VCC = Max. Standard Input(5) Standard I/O(5) Bus-hold Input Bus-hold I/O Standard Input(5) Standard I/O(5) Bus-hold Input Bus-hold I/O Bus-hold Input VCC = Min. VI = GND Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC Min. Typ.(2) Max. mV A Unit V A

Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = Min. VIN = VIH or VIL VCC = Min. VIN = VIH or VIL IOH = 6mA MIL IOH = 8mA COM'L IOL = 6mA MIL IOL = 8mA COM'L 0.55 V Min. 48 3.3 Max. 96 96 Unit mA V

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Duration of the condition can not exceed one second. 5. The test limit for this parameter -55C. 6. Does not include Bus-Hold I/O pins.


 

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