Details, datasheet, quote on part number: IDT54FCT162952DT
PartIDT54FCT162952DT
CategoryLogic => Bus Interface => Bus Oriented Circuits
Title16/32-Bit Bus Transceiver->CMOS/BiCMOS->FCT/FCT-T
DescriptionFast CMOS 16-bit Registered Transceiver
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT162952DT datasheet
  

 

Features, Applications

MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage 1µ A (max.) ESD > 2000V per MIL-STD-883, Method > 200V using machine model 0) 25 mil pitch SSOP, 19.6 mil pitch TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch CERPACK packages Extended commercial range to +85°C Balanced Output Drivers: ±24mA (commercial) ±16mA (military) Reduced system switching noise Typical VOLP (Output Ground Bounce) 0.6V at VCC = 25°C

The FCT162952AT/BT/CT/ET 16-bit registered transceiver is built using advanced dual metal CMOS technology. These high-speed, lowpower devices are organized as two independent 8-bit D-type registered transceivers with separate input and output control for independent control of data flow in either direction. For example, the A-to-B Enable (x CEAB) must be LOW to enter data from the A port. xCLKAB controls the clocking function. When xCLKAB toggles from LOW-to-HIGH, the data present on the A port will be clocked into the register. xOEAB performs the output enable function on the B port. Data flow from the B port to A port is similar but requires using xCEBA, xCLKBA, and xOEBA inputs. Full 16-bit operation is achieved by tying the control pins of the independent transceivers together. The FCT162952AT/BT/CT/ET have balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times­reducing the need for external series terminating resistors. The FCT162952AT/BT/CT/ET are plug-in replacements for the FCT16952AT/BT/CT/ET and ABT16952 for on-board bus interface applications.


Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXXT Output and I/O terminals. 3. Output and I/O terminals for FCT162XXXT.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 Max. 6 8 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Pin Names xOEAB xOEBA xCEAB xCEBA xCLKAB xCLKBA xAx xBx Description A-to-B Output Enable Input (Active LOW) B-to-A Output Enable Input (Active LOW) A-to-B Clock Enable Input (Active LOW) B-to-A Clock Enable Input (Active LOW) A-to-B Clock Input B-to-A Clock Input A-to-B Data Inputs or B-to-A 3-State Outputs(1) B-to-A Data Inputs or A-to-B 3-State Outputs(1)

NOTES: 1. A-to-B data flow is shown: B-to-A data flow is similar but uses xCEBA, xCLKBA, and xOEBA. 2. Level of B before the indicated steady-state input conditions were established. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care = LOW-to-HIGH Transition Z = High-impedance

Following Conditions Apply Unless Otherwise Specified: Commercial: to +85°C, VCC 5.0V ±10%; Military: to +125°C, VCC 5.0V ±10%

Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VH ICCL ICCH ICCZ Parameter Input HIGH Level Input LOW Level Input HIGH Current (Input pins)(5) Input HIGH Current (I/O pins)(5) Input LOW Current (Input pins)(5) Input LOW Current (I/O pins)(5) High Impedance Output Current (3-State Output pins)(5) Clamp Diode Voltage Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC = Min., IIN = ­18mA VCC = Max., = GND(3) VCC = Max. VI = GND Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC Min. ­80 Typ.(2) Max. mV µA Unit V µA

Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = Min. VIN = VIH or VIL VCC = Min. VIN = VIH or VIL IOH = ­16mA MIL. IOH = ­24mA COM'L. IOL = 16mA MIL. IOL = 24mA COM'L

NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25°C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Duration of the condition can not exceed one second. 5. The test limit for this parameter = -55°C.


 

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