Details, datasheet, quote on part number: IDT54FCT162841BTPV
PartIDT54FCT162841BTPV
CategoryLogic => Latches => CMOS/BiCMOS->FCT/FCT-T Family
TitleCMOS/BiCMOS->FCT/FCT-T Family
DescriptionFast CMOS 20-bit Transparent Latch
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT162841BTPV datasheet
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Features, Applications

0.5 MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage 1µA (max.) VCC 5V ±10% Balanced Output Drivers ±24mA Reduced system switching noise Typical VOLP (Output Ground Bounce) 0.6V at VCC = 25°C Available in SSOP and TSSOP packages

The FCT162841T 20-bit transparent D-type latches are built using advanced dual metal CMOS technology. These high-speed, low-power latches are ideal for temporary data storage. They can be used for implementing memory address latches, I/O ports, and bus drivers. The Output Enable (OE) and Latch Enable (LE) controls are organized to operate each device as two 10-bit latches or one 20-bit latch. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT162841T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times­reducing the need for external series terminating resistors. The is a plug-in replacement for the FCT16841T and ABT16841 for on-board interface applications.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

Symbol Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max to +120 Unit °C mA

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXX Output and I/O terminals. 3. Outputs and I/O terminals for FCT162XXX.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 Max. 6 8 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Pin Names xDx xLE x Qx Data Inputs Latch Enable Inputs (Active HIGH) Output Enable Inputs (Active LOW) 3-State Outputs Description

NOTES: H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-Impedance 2. Output level before xLE HIGH-to-LOW transition.

Following Conditions Apply Unless Otherwise Specified: Industrial: to +85°C, VCC 5.0V ±10%

Symbol VIH VIL IIH Parameter Input HIGH Level Input LOW Level Input HIGH Current (Input pins)(5) Input HIGH Current (I/O pins)(5) IIL Input LOW Current (Input pins)(5) Input LOW Current (I/O pins)(5) IOZH IOZL VIK IOS VH ICCL ICCH ICCZ High Impedance Output Current (3-State Output pins)(5) Clamp Diode Voltage Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max. VIN = GND or VCC = Min., IIN = ­18mA VCC = Max., = GND(3) VCC = Max. VI = GND Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC Min. ­80 Typ.(2) Max. mV µA Unit V µA

Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = Min IOH = ­24mA VIN = VIH or VIL VCC = Min IOH = 24mA VIN = VIH or VIL Min. 2.4 Typ.(2) Max. ­200 0.55 Unit mA V

NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. Duration of the condition can not exceed one second. 5. This test limit for this parameter = ­55°C.


 

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