Details, datasheet, quote on part number: IDT54FCT162823CT
PartIDT54FCT162823CT
CategoryLogic => Bus Interface => Bus Oriented Circuits
TitleBus Oriented Circuits
DescriptionFast CMOS 18-bit Register
CompanyIntegrated Device Technology, Inc.
DatasheetDownload IDT54FCT162823CT datasheet
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Features, Applications

0.5 MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage 1A (max.) VCC 5V 10% Balanced Output Drivers of 24mA Reduced system switching noise Typical VOLP (Output Ground Bounce) 0.6V at VCC = 25C Available in SSOP and TSSOP packages

The FCT162823T 18-bit bus interface register is built using advanced, dual metal CMOS technology. These high-speed, low-power registers with clock enable (xCLKEN) and clear (xCLR) controls are ideal for parity bus interfacing in high-performance synchronous systems. The control inputs are organized to operate the device as two 9-bit registers or one 18-bit register. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT162823T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times reducing the need for external series terminating resistors. The is a plug-in replacement for the FCT16823T and ABT16823 for on-board interface applications.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

Symbol Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max to +120 Unit C mA

NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXX Output and I/O terminals. 3. Outputs and I/O terminals for FCT162XXX.

Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 3.5 Max. 6 8 Unit pF

NOTE: 1. This parameter is measured at characterization but not tested.

Pin Names xDx xCLK xCLKEN xCLR x OE xOx Data Inputs Clock Inputs Clock Enable Inputs (Active LOW) Asynchronous clear Inputs (Active LOW) Output Enable Inputs (ActiveLOW) 3-State Outputs Description

xOE xCLR Inputs xCLKEN xCLK X xDx Outputs xQx Function Z High Z L Clear Q(2) Hold Z Load L H

NOTES: H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-Impedance 2. Output level before indicated steady-state input conditions were established.

Following Conditions Apply Unless Otherwise Specified: Industrial: to +85C, VCC 5.0V 10%

Symbol VIH VIL IIH IIL IOZH IOZL VIK IOS VH ICCL ICCH ICCZ Parameter Input HIGH Level Input LOW Level Input HIGH Current (Input pins)(4) Input HIGH Current (I/O pins)(4) Input LOW Current (Input pins)(4) Input LOW Current (I/O pins)(4) High Impedance Output Current (3-State Output pins)(4) Clamp Diode Voltage Short Circuit Current Input Hysteresis Quiescent Power Supply Current VCC = Max VIN = GND or VCC = Min., IIN = 18mA VCC = Max., = GND(3) VCC = Max. VI = GND Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VI = VCC Min. 80 Typ.(2) Max. mV A Unit V A

Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = 5V, VIN = VIH or VIL, = 1.5V(3) VCC = Min. VIN = VIH or VIL VCC = Min. VIN = VIH or VIL

NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. This test limit for this parameter = 55C.


 

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